GE’s new phoenix nanotom m system provides 3D metrology and analysis
December 1, 2010
GE Sensing & Inspection Technologies GmbH, based in Wunstorf, Germany, recently announced the development of its ‘phoenix nanotom m’ non-destructive, 3D analysis and metrology system.
GE’s nanotom m
The process has been developed to fulfill the fast growing demand for high resolution and high precision X-ray computed tomography (CT) in non-destructive 3D analysis and 3D metrology. Featuring fully automated CT scan execution, volume reconstruction and the analysis process, it offers ease of use as well as fast and reproducible CT results, in numerous applications.
In relation to powder metallurgy applications, Dr. Dirk Neuber, of Product Marketing at GE’s Measurement & Control Solutions business told ipmd.net, “You can use this system for non destructive analysis of porosity in moulded parts or shrinkage cavities in sintered parts as well as for fast and easy 3D metrology, e.g. act. / nom. variance analysis with the CAD data, internal wall thickness analysis etc.”
The nanotom m incorporates a new phoenix 180kV/15W, high-power nanofocus X-ray tube, which is optimized for long-term stability and allows scanning of high absorbing materials such as metals and ceramics. The internal cooling of the tube also significantly reduces thermal effects such as drift, to ensure even sharper imaging as well as allowing the long scanning times frequently required in scientific research.
The new CT system also features a very high dynamic range, typically five times better than current state-of-the-art nanoCT equipment, thanks to its temperature-stabilized, 3072 x 2400 pixel DXR 500L detector from GE. With such a large detector area, this allows sample sizes of up to 250 x 240 mm and the combination of proprietary GE technology in terms of X-ray tube, detector, generator and CT software ensures that a voxel size of down to 300 nm (0.3 µm) can be achieved.
For more information visit www.ge-mcs.com/phoenix
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