Short courses focus on particle and molecular characterisation

January 26, 2011

Malvern Instruments will run two one-day short courses as part of the established program at Pittcon 2011 (March 13 -18,  Atlanta GA, USA). The first of these covers the fundamentals of particle sizing with an emphasis on light scattering techniques, and the second examines molecular and particle characterisation by dynamic light scattering and zeta potential.

Fundamentals of Particle Size Analysis with an Emphasis on Light Scattering Techniques

This course will take place on March 14 and will bring newcomers to the particle sizing field up to speed on the basics of particle size analysis. The main techniques (sieves, sedimentation, electrozone sensing) will be covered with an emphasis on dynamic light scattering and laser diffraction.

More information: http://bit.ly/aTT7Sw 

Molecular and Particle Characterization by Dynamic Light Scattering and Zeta Potential

The second short course takes place on March 16 and will discuss, review and provide useful tips for dynamic light scattering (DLS, PCS, QELS), molecular weight and electrophoretic light scattering (zeta potential) measurements.

More information: http://bit.ly/cSriss


Registration is open for both via the Pittcon website www.pittcon.org

www.malvern.com

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